Latest News & Publications

   
         
   

This section contains latest corporate news.
Please contact Hans Loeschner () for further information.

 

   
             
   
2010-Sep-14
top

Oral presentation at BACUS2010 -  SPIE Photomask Technology

Conference information: http://spie.org/x6323.xml

Presentation of Elmar Platzgummer:
eMET - 50 keV electron Mask Exposure Tool development based on proven multi-beam
projection technology”

   
             
    2010-Apr-14
top

Oral presentation at PMJ2010 -  SPIE Photomask Japan

Conference information: www.photomask-japan.org

Presentation of Hans Loeschner:
eMET: Development of a 50 keV electron projection multi-beam Mask Exposure Tool for the
16nm hp Technology Node and below”

   
             
    2010-Feb-23
top

Keynote and oral talks at SPIE Advanced Lithography 2010 – Alternative Lithographic Technologies, San Jose, California, USA

Conference information: http://spie.org/

Keynote of Elmar Platzgummer:
“Maskless Lithography and Nanopatterning with Electron and Ion Multi-Beam Projection”
 
Presentation of Christof Klein:
“50 keV electron beam projection maskless lithography (PML2): results obtained with 2,500 programmable 12.5nm sized beams”

   
             
    2010-Jan-20
top

Invited and oral talks at EMLC 2010 – The 26th European Mask and Lithography Conference, Grenoble, France

Conference information: www.EMLC2010.com

Presentation of Christof Klein:
“Projection Mask-Less Lithography and Nanopatterning with Electron and Ion Multi-Beams”

Invited talk of Falco van Delft / Philips Research MiPlaza, Einhoven, Netherlands, IMS Nanofabrication co-authors Hans Loeschner and Elmar Platzgummer:
“Masters for Substrate Conformal Imprint Lithography (SCIL) generated by Charged Particle Nanopatterning (CHARPAN) Techniques”

   
             
    2009-Nov-19
top

Invited talk at MNC09 – 2009 International Microprocesses and Nanotechnology Conference, Sapporo, Japan

Conference information:  http://www.imnc.jp/
Paper to be published in Jap. J. Appl. Phys.: http://jjap.ipap.jp/

Invited talk of Hans Loeschner:
Projection Charged Particle Nanolithography and Nanopatterning”

CHARPAN Tool fabricated 12.5nm hp dots and lines in 20nm HSQ on Si:

12.5nm dots12.5nm lines

Discussion of the throughput potential of Multi-Axis-PML2 tool configurations:

multi-axis-pml2

(format and data points for Gaussian Beam, Shaped Beam and ML2 apart from Multi-Axis-PML2: Hans C Pfeiffer, plenary talk at MNE 2009, Ghent, Sept 29, 2009)

   
             
    2009-Sept-30
top
 

Presentations at MNE 2009, Ghent, Belgium

Conference Info: http://www.mne09.org/
MNE 2009 proceedings: http://www.elsevier.com  http://www.sciencedirect.com 

Presentation of Christof Klein:

“PML2 – Projection Mask-Less Lithography”


PML2 PoC Tool


APS

 

POC 50keV

2500 programmable 12.5nm multibeams @ 50keV in 50nm HSQ

31nm half-pitch25nm half-pitch

 

40nm hpRIMANA

RIMANA

   
     
top

Presentation of Falco van Delft / Philips Research MiPlaza, Eindhoven, Netherlands, with IMS Nanofabrication co-authors Hans Loeschner and Elmar Platzgummer:


“Charged Particle Nanopatterning (CHARPAN) of 2D and 3D masters for flexible replication in Substrate Conformal Imprint Lithography (SCIL)”

 

2D 3D Master

Master stamp

Master stamp

SCIL results

 

   
             
    2009-Sept-16
top

Presentation at SPIE Photomask BACUS 2009, Monterey, California, USA

Conference and proceedings information: http://spie.org/

SPIE Photomask BACUS 2009 Best Presentation / 3rd Award :

http://spie.org/Documents/Membership/BacusNewsletters/BACUS-Newsletter-February-2010.pdf


Presentation of Elmar Platzgummer:
“Charged particle multibeam lithography evaluations for sub-16-nm hp mask node fabrication”

 

sub-16-nm hp mask node


Tool


43k APS




APS





resolution CHARPAN


grey-scaling

redundancy

hard mask


LER-CD-LWR CHARPAN



resolution

resolution 12.5nm


POC 15keV

45nm RIMANA

RIMANA



BACUS

 

   
             
     
top

Poster presentation of Florian Letzkus / Institute for Microelectronics Stuttgart, IMS Nanofabrication co-authors: Christof Klein, Hans Loeschner and Elmar Platzgummer:

“3D Si Aperture-Plates combined with programmable Blanking-Plates for Multi-Beam Mask Writing”

 

3D Si-APS


3D Si-APS




3d Si-APS



3D Si-APS SEM



Cross talk

 

   
             
    2009-July-01
top

The 2009 Lithography Workshop, Coeur d’Alene, Idaho, USA

Conference information and presentations: http://www.lithoworkshop.org

Invited talk of Laurent Pain / CEA-Leti, on behalf of Christof Klein:

“PML2 – Projection Mask-Less Lithography: The High Energy ML2 Solution within MAGIC”

   
             
    2009-May- 26
to 29
top

EIPBN 2009 – The 53rd International Conference on Electron, Ion and Photo Beam Technology & Nanofabrication, Marco Island, Florida, USA

Conference information: www.eipbn.org
Proceedings: http://scitation.aip.org/jvstb/

Invited talk of Hans Loeschner, on behalf of Elmar Platzgummer:
“Charged Particle Nanopatterning (CHARPAN)”

Invited talk of Mathias Irmscher / Institute for Microelectronics Stuttgart, on behalf of Christof Klein:
“Programmable Aperture Plate System with integrated CMOS electronics for projection maskless nanolithography and nanopatterning”

Talk of Christoph Ebm:
Ion Multi-Beam Nanopatterning for Photonic Applications: Experiments and Simulations, Including Study of Precursor Gas iInduced Etching and Deposition”

Talk of Hans Loeschner, on behalf of Gang Chen / Johannes Kepler University Linz:
Positioning of Nanocrystals on Prestructured Substrates”

   
             
             
             
   

Copyright by IMS Nanofabrication AG, Vienna, Austria, Last update: 27 April 2010

imprint